Please note:
To view the Fall 2024 Academic Calendar, go to www.sfu.ca/students/calendar/2024/fall.html.
Structural Analysis of Materials PHYS 864 (3)
The application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. Hands-on instruction about the operation of a TEM and x-ray diffractometers is provided. The basic theory required for analyzing TEM and x-ray images and diffraction data is described. Prerequisite: Permission of instructor.
| Section | Instructor | Day/Time | Location |
|---|---|---|---|
|
Karen Kavanagh |
Jan 6 – Apr 9, 2025: Mon, Wed, Fri, 12:30–1:20 p.m.
|
Burnaby |