Structural Analysis of Materials PHYS 864 (3)
The application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. Hands-on instruction about the operation of a TEM and x-ray diffractometers is provided. The basic theory required for analyzing TEM and x-ray images and diffraction data is described. Prerequisite: Permission of instructor.
| Section | Instructor | Day/Time | Location |
|---|---|---|---|
|
Karen kavanagh |
Sep 4 – Dec 3, 2018: Tue, 11:30 a.m.–1:20 p.m.
Sep 4 – Dec 3, 2018: Thu, 11:30 a.m.–12:20 p.m. |
Burnaby Burnaby |