間眅埶AV

i Please note:  

To view the current calendar, go to

Structural Analysis of Materials PHYS 864 (3)

The application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. Hands-on instruction about the operation of a TEM and x-ray diffractometers is provided. The basic theory required for analyzing TEM and x-ray images and diffraction data is described. Prerequisite: Permission of instructor.