Structural Analysis of Materials PHYS 864 (3)
The application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. Hands-on instruction about the operation of a TEM and x-ray diffractometers is provided. The basic theory required for analyzing TEM and x-ray images and diffraction data is described. Prerequisite: Permission of instructor.
| Section | Instructor | Day/Time | Location |
|---|---|---|---|
|
Karen kavanagh |
Sep 8 – Dec 7, 2015: Tue, Thu, 8:30–9:50 a.m.
|
Burnaby |